Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics
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Motivated by the observed thickness-scaling of the coercive field in ferroelectric films over five decades, we develop a statistical approach towards understanding the conceptual underpinnings of this behavior. Here the scaling exponent is determined by the field-dependence of a known and measured quantity, the nucleation rate per unit area. We end with a discussion of our initial assumptions and point to instances where they could no longer be applicable.
Contribution for Proceedings of EMF 2003 (Cambridge, UK)
Contribution for Proceedings of EMF 2003 (Cambridge, UK)