Observed Effects of a Changing Step-Edge Density on Thin-Film Growth Dynamics

dc.creatorFleet, Aaron
dc.creatorDale, Darren
dc.creatorSuzuki, Y.
dc.creatorBrock, J. D.
dc.date2004-08-31
dc.date.accessioned2026-07-25T23:16:19Z
dc.descriptionWe grew SrTiO3 on SrTiO3 [001] by pulsed laser deposition, while observing x-ray diffraction at the (0 0 .5) position. The drop dI in the x-ray intensity following a laser pulse contains information about plume-surface interactions. Kinematic theory predicts dI/I = -4sigma(1-sigma), so that dI/I depends only on the amount of deposited material sigma. In contrast, we observed experimentally that |dI/I| < 4sigma(1-sigma), and that dI/I depends on the phase of x-ray growth oscillations. The combined results suggest a fast smoothing mechanism that depends on surface step-edge density.
dc.description4 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0408704
dc.identifierhttp://arxiv.org/abs/cond-mat/0408704
dc.identifierPhysical Review Letters, vol. 94, art no 036102 (2005)
dc.identifierdoi:10.1103/PhysRevLett.94.036102
dc.identifier.urihttps://dspace.dare.co.zw/handle/123456789/97066
dc.subjectMaterials Science
dc.titleObserved Effects of a Changing Step-Edge Density on Thin-Film Growth Dynamics
dc.typetext

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