Mapping the spin-dependent electron reflectivity of Fe and Co ferromagnetic thin films
| dc.creator | Graf, J. | |
| dc.creator | Jozwiak, C. | |
| dc.creator | Schmid, A. K. | |
| dc.creator | Hussain, Z. | |
| dc.creator | Lanzara, A. | |
| dc.date | 2004-04-29 | |
| dc.date | 2005-05-30 | |
| dc.date.accessioned | 2026-07-25T23:09:46Z | |
| dc.description | Spin Polarized Low Energy Electron Microscopy is used as a spin dependent spectroscopic probe to study the spin dependent specular reflection of a polarized electron beam from two different magnetic thin film systems: Fe/W(110) and Co/W(110). The reflectivity and spin-dependent exchange-scattering asymmetry are studied as a function of electron kinetic energy and film thickness, as well as the time dependence. The largest value of the figure of merit for spin polarimetry is observed for a 5 monolayer thick film of Co/W(110) at an electron kinetic energy of 2eV. This value is 2 orders of magnitude higher than previously obtained with state of the art Mini-Mott polarimeter. We discuss implications of our results for the development of an electron-spin-polarimeter using the exchange-interaction at low energy. | |
| dc.description | 5 pages, 4 figures | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0404720 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0404720 | |
| dc.identifier | Phys. Rev. B 71, 144429 (2005) | |
| dc.identifier | doi:10.1103/PhysRevB.71.144429 | |
| dc.identifier.uri | https://dspace.dare.co.zw/handle/123456789/95977 | |
| dc.subject | Materials Science | |
| dc.subject | Other Condensed Matter | |
| dc.title | Mapping the spin-dependent electron reflectivity of Fe and Co ferromagnetic thin films | |
| dc.type | text |